Sem edx analysis pdf

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Why are oil analyses so important? 2017 ENGIE LABORELEC – E-MAIL: info. The most common SEM mode is detection of secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons that can be detected depends, among other things, on specimen topography. By scanning the sample and collecting the secondary electrons that are emitted using a special detector, an image displaying the topography of the surface is created.

The signals used by a scanning electron microscope to produce an image result from interactions of the electron beam with atoms at various depths within the sample. In secondary electron imaging, or SEI, the secondary electrons are emitted from very close to the specimen surface. Consequently, SEM can produce very high-resolution images of a sample surface, revealing details less than 1 nm in size. Due to the very narrow electron beam, SEM micrographs have a large depth of field yielding a characteristic three-dimensional appearance useful for understanding the surface structure of a sample. This is exemplified by the micrograph of pollen shown above. No conductive coating was applied: such a coating would alter this fragile specimen. Samples for SEM have to be prepared to withstand the vacuum conditions and high energy beam of electrons, and have to be of a size that will fit on the specimen stage.

Samples are generally mounted rigidly to a specimen holder or stub using a conductive adhesive. SEM is used extensively for defect analysis of semiconductor wafers, and manufacturers make instruments that can examine any part of a 300 mm semiconductor wafer. Nonconductive specimens collect charge when scanned by the electron beam, and especially in secondary electron imaging mode, this causes scanning faults and other image artifacts. In ESEM instruments the specimen is placed in a relatively high-pressure chamber and the electron optical column is differentially pumped to keep vacuum adequately low at the electron gun. Synthetic replicas can be made to avoid the use of original samples when they are not suitable or available for SEM examination due to methodological obstacles or legal issues.

Embedding in a resin with further polishing to a mirror-like finish can be used for both biological and materials specimens when imaging in backscattered electrons or when doing quantitative X-ray microanalysis. The main preparation techniques are not required in the environmental SEM outlined below, but some biological specimens can benefit from fixation. For SEM, a specimen is normally required to be completely dry, since the specimen chamber is at high vacuum. If the SEM is equipped with a cold stage for cryo microscopy, cryofixation may be used and low-temperature scanning electron microscopy performed on the cryogenically fixed specimens. Freeze-fracturing, freeze-etch or freeze-and-break is a preparation method particularly useful for examining lipid membranes and their incorporated proteins in “face on” view. The preparation method reveals the proteins embedded in the lipid bilayer. This section does not cite any sources.

Back-scattered electron imaging, quantitative X-ray analysis, and X-ray mapping of specimens often requires grinding and polishing the surfaces to an ultra smooth surface. Specimens that undergo WDS or EDS analysis are often carbon-coated. Fractography is the study of fractured surfaces that can be done on a light microscope or, commonly, on an SEM. The fractured surface is cut to a suitable size, cleaned of any organic residues, and mounted on a specimen holder for viewing in the SEM.

The SEM in the first case may be incorporated into the FIB. Metals, geological specimens, and integrated circuits all may also be chemically polished for viewing in the SEM. Special high-resolution coating techniques are required for high-magnification imaging of inorganic thin films. In a typical SEM, an electron beam is thermionically emitted from an electron gun fitted with a tungsten filament cathode. The electron beam, which typically has an energy ranging from 0. 2 keV to 40 keV, is focused by one or two condenser lenses to a spot about 0. When the primary electron beam interacts with the sample, the electrons lose energy by repeated random scattering and absorption within a teardrop-shaped volume of the specimen known as the interaction volume, which extends from less than 100 nm to approximately 5 µm into the surface.